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KMID : 0381920080380030185
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Korean Journal of Microscopy
2008 Volume.38 No. 3 p.185 ~ p.193
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Imaging Plate Technique for the Electron Diffraction Study of a Radiation-sensitive Material under Electron Beam
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Kim Young-Min
Kim Yang-Soo
Kim Jin-Gyu
Lee Jeong-Yong
Kim Youn-Joong
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Abstract
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An experimental comparison of the detection properties between imaging plate and film for recording the electron diffraction
pattern was carried out on a radiation-sensitive material, an aluminum trihydroxide (gibbsite, γ-Al(OH)3), through the electron beam irradiation. Because the imaging plate has a wide dynamic range sufficient for recording extremely low- and high-electron intensities, the range of spatial frequency for the diffraction pattern acquired by the imaging plate was extended to two times larger than the range by the film, especially at a low electron dose condition (?0.1 e-/μm2). It is also demonstrated that the imaging plate showed better resolving power for discriminating fine intensity levels even in saturated transmitted beam. Hence, in the respect of investigating the structures of radiation-sensitive materials and cryobiological specimens, our experimental demonstrations suggest that the imaging plate technique may be a good choice for those studies, which have to use an extremely low electron intensity for recording.
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KEYWORD
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Imaging plate, Film, Electron diffraction, Radiation-sensitive materials
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